Bayesian Estimation of Thermal Properties Using Periodically Pulsed Photothermal Radiometry: A Focus on Interfacial Thermal Resistances between Layers
| dc.rights.license | open | en_US |
| hal.structure.identifier | Institut de Mécanique et d'Ingénierie [I2M] | |
| dc.contributor.author | CHASSAIN, Clément | |
| hal.structure.identifier | Institut de Mécanique et d'Ingénierie [I2M] | |
| dc.contributor.author | KUSIAK, Andrzej | |
| hal.structure.identifier | Institut de Mécanique et d'Ingénierie [I2M] | |
| dc.contributor.author | KRAUSE, Kevin | |
| hal.structure.identifier | Institut de Mécanique et d'Ingénierie [I2M] | |
| dc.contributor.author | GARCIA, Marine | |
| hal.structure.identifier | Institut de Mécanique et d'Ingénierie [I2M] | |
| dc.contributor.author | BATTAGLIA, Jean-Luc
IDREF: 084712562 | |
| dc.date.accessioned | 2023-03-20T10:08:24Z | |
| dc.date.available | 2023-03-20T10:08:24Z | |
| dc.date.issued | 2023-02-01 | |
| dc.identifier.issn | 1862-6270 | en_US |
| dc.identifier.uri | https://oskar-bordeaux.fr/handle/20.500.12278/172375 | |
| dc.description.abstractEn | Pulsed periodic photothermal radiometry (PPTR) allows the investigation of multilayered samples with layer thicknesses of a few hundred nanometers over a duration of a few nanoseconds. The link between theoretical calculations and experimentation is made using a Bayesian approach based on the Metropolis–Hastings algorithm. The accuracy of the PPTR method requires precise calibration to provide an accurate proper emission measurement. Furthermore, the normalization time needs to be optimized through sensitivity analysis. Without this sensitivity analysis, it is impossible to simultaneously estimate the interfacial thermal resistances in a multilayered sample. The method is tested on multilayered samples composed of platinum (Pt), titanium nitride (TiN), silicon nitride (SiN), and silicon (Si). The parameters identified are interfacial thermal resistances between Pt–TiN and TiN–SiN. | |
| dc.language.iso | EN | en_US |
| dc.subject.en | Interfacial thermal resistances | |
| dc.subject.en | Inverse methods | |
| dc.subject.en | Markov chain Monte Carlo | |
| dc.subject.en | Multilayered | |
| dc.subject.en | Nanoscales | |
| dc.subject.en | Normalization methods | |
| dc.title.en | Bayesian Estimation of Thermal Properties Using Periodically Pulsed Photothermal Radiometry: A Focus on Interfacial Thermal Resistances between Layers | |
| dc.type | Article de revue | en_US |
| dc.identifier.doi | 10.1002/pssr.202200328 | en_US |
| dc.subject.hal | Sciences de l'ingénieur [physics]/Matériaux | en_US |
| dc.description.sponsorshipEurope | European Union’s Horizon 2020 research and innovation programme | en_US |
| bordeaux.journal | physica status solidi (RRL) – Rapid Research Letters | en_US |
| bordeaux.volume | n/a | en_US |
| bordeaux.hal.laboratories | Institut de Mécanique et d’Ingénierie de Bordeaux (I2M) - UMR 5295 | en_US |
| bordeaux.issue | n/a | en_US |
| bordeaux.institution | Université de Bordeaux | en_US |
| bordeaux.institution | Bordeaux INP | en_US |
| bordeaux.institution | CNRS | en_US |
| bordeaux.institution | INRAE | en_US |
| bordeaux.institution | Arts et Métiers | en_US |
| bordeaux.peerReviewed | oui | en_US |
| bordeaux.inpress | non | en_US |
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| hal.export | true | |
| dc.rights.cc | Pas de Licence CC | en_US |
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