Mostrar el registro sencillo del ítem

Thermoreflectance temperature measurement with millimeter wave

hal.structure.identifierInstitut de Mécanique et d'Ingénierie de Bordeaux [I2M]
dc.contributor.authorPRADERE, Christophe
hal.structure.identifierInstitut de Mécanique et d'Ingénierie de Bordeaux [I2M]
dc.contributor.authorCAUMES, Jean-Pascal
hal.structure.identifierInstitut de Mécanique et d'Ingénierie de Bordeaux [I2M]
dc.contributor.authorBENKHEMIS, S.
hal.structure.identifierLaboratoire Ondes et Matière d'Aquitaine [LOMA]
dc.contributor.authorPERNOT, Gilles
hal.structure.identifierInstitut de Mécanique et d'Ingénierie de Bordeaux [I2M]
dc.contributor.authorPALOMO, E.
hal.structure.identifierLaboratoire Ondes et Matière d'Aquitaine [LOMA]
dc.contributor.authorDILHAIRE, Stefan
hal.structure.identifierInstitut de Mécanique et d'Ingénierie de Bordeaux [I2M]
dc.contributor.authorBATSALE, Jean-Christophe
dc.date.created2014-04-08
dc.date.issued2014-06-01
dc.identifier.issn0034-6748
dc.description.abstractEnGigaHertz (GHz) thermoreflectance technique is developed to measure the transient temperature of metal and semiconductor materials located behind an opaque surface. The principle is based on the synchronous detection, using a commercial THz pyrometer, of a modulated millimeter wave (at 110 GHz) reflected by the sample hidden behind a shield layer. Measurements were performed on aluminum, copper, and silicon bulks hidden by a 5 cm thick Teflon plate. We report the first measurement of the thermoreflectance coefficient which exhibits a value 100 times higher at 2.8 mm radiation than those measured at visible wavelengths for both metallic and semiconductor materials. This giant thermoreflectance coefficient κ, close to 10−3 K−1 versus 10−5 K−1 for the visible domain, is very promising for future thermoreflectance applications.
dc.language.isoen
dc.publisherAmerican Institute of Physics
dc.rights.urihttp://creativecommons.org/licenses/by-nc/
dc.title.enThermoreflectance temperature measurement with millimeter wave
dc.typeArticle de revue
dc.identifier.doi10.1063/1.4884639
dc.subject.halPhysique [physics]/Physique [physics]/Optique [physics.optics]
bordeaux.journalReview of Scientific Instruments
bordeaux.page064904 (1-3)
bordeaux.volume85
bordeaux.issue6
bordeaux.peerReviewedoui
hal.identifierhal-01064000
hal.version1
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-01064000v1
bordeaux.COinSctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Review%20of%20Scientific%20Instruments&rft.date=2014-06-01&rft.volume=85&rft.issue=6&rft.spage=064904%20(1-3)&rft.epage=064904%20(1-3)&rft.eissn=0034-6748&rft.issn=0034-6748&rft.au=PRADERE,%20Christophe&CAUMES,%20Jean-Pascal&BENKHEMIS,%20S.&PERNOT,%20Gilles&PALOMO,%20E.&rft.genre=article


Archivos en el ítem

ArchivosTamañoFormatoVer

No hay archivos asociados a este ítem.

Este ítem aparece en la(s) siguiente(s) colección(ones)

Mostrar el registro sencillo del ítem