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Investigations on electro-optical and thermal performances degradation of high power density GaAs-based laser diode in vacuum environment

hal.structure.identifierLaboratoire Ondes et Matière d'Aquitaine [LOMA]
dc.contributor.authorMICHAUD, J.
hal.structure.identifierALPhANOV
dc.contributor.authorPEDROZA, G.
hal.structure.identifierLaboratoire de l'intégration, du matériau au système [IMS]
dc.contributor.authorBÉCHOU, L.
hal.structure.identifierAdvEOTec
dc.contributor.authorHOW, L.S.
hal.structure.identifierCentre National d'Études Spatiales [Toulouse] [CNES]
dc.contributor.authorGILARD, O.
hal.structure.identifierCentre National d'Études Spatiales [Toulouse] [CNES]
dc.contributor.authorVEYRIÉ, D.
hal.structure.identifier35 Photonics
dc.contributor.authorLARUELLE, F.
hal.structure.identifierLaboratoire Ondes et Matière d'Aquitaine [LOMA]
dc.contributor.authorGRAUBY, S.
dc.date.created2015-05-22
dc.date.issued2015-08
dc.identifier.issn0026-2714
dc.description.abstractEnPump laser diodes emitting at 980 nm are typically used in distribution network transmission systems and are now implemented in space missions for intra-satellite communication links and calibration systems. Nevertheless, since the pump source is potentially a critical point for such systems, there is a huge need to assess their reliability in space environment, especially in terms of operation under vacuum conditions. We have then studied the electro-optical behavior of several 980 nm laser diodes and shown that they may degrade more rapidly when submitted to a vacuum environment. Then, spatially resolved temperature variations have been measured by thermoreflectance on the laser diode front facet and have shown a temperature variation increase under vacuum conditions, in particular near the emission region, where a catastrophic optical damage is most likely to occur. This temperature variation increase could then be one of the causes for the more rapid laser diode degradation.
dc.language.isoen
dc.publisherElsevier
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/
dc.subject.enLaser diode
dc.subject.enThermal mapping
dc.subject.enThermoreflectance
dc.subject.enElectro-optical characterization
dc.subject.enVacuum
dc.title.enInvestigations on electro-optical and thermal performances degradation of high power density GaAs-based laser diode in vacuum environment
dc.typeArticle de revue
dc.identifier.doi10.1016/j.microrel.2015.06.068
dc.subject.halPhysique [physics]/Physique [physics]/Optique [physics.optics]
dc.subject.halSciences de l'ingénieur [physics]/Micro et nanotechnologies/Microélectronique
bordeaux.journalMicroelectronics Reliability
bordeaux.page1746-1749
bordeaux.volume55
bordeaux.issue9-10
bordeaux.peerReviewedoui
hal.identifierhal-01256856
hal.version1
hal.popularnon
hal.audienceInternationale
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-01256856v1
bordeaux.COinSctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Microelectronics%20Reliability&rft.date=2015-08&rft.volume=55&rft.issue=9-10&rft.spage=1746-1749&rft.epage=1746-1749&rft.eissn=0026-2714&rft.issn=0026-2714&rft.au=MICHAUD,%20J.&PEDROZA,%20G.&B%C3%89CHOU,%20L.&HOW,%20L.S.&GILARD,%20O.&rft.genre=article


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