Nano-proximity direct ion beam writing
SENIUTINAS, Gediminas
Centre for Micro-Photonics [Hawthorn]
Melbourne Centre for Nanofabrication [MCN]
Centre for Micro-Photonics [Hawthorn]
Melbourne Centre for Nanofabrication [MCN]
GERVINSKAS, Gediminas
Centre for Micro-Photonics [Hawthorn]
Melbourne Centre for Nanofabrication [MCN]
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Centre for Micro-Photonics [Hawthorn]
Melbourne Centre for Nanofabrication [MCN]
SENIUTINAS, Gediminas
Centre for Micro-Photonics [Hawthorn]
Melbourne Centre for Nanofabrication [MCN]
Centre for Micro-Photonics [Hawthorn]
Melbourne Centre for Nanofabrication [MCN]
GERVINSKAS, Gediminas
Centre for Micro-Photonics [Hawthorn]
Melbourne Centre for Nanofabrication [MCN]
Centre for Micro-Photonics [Hawthorn]
Melbourne Centre for Nanofabrication [MCN]
HAKOBYAN, Davit
Centre for Micro-Photonics [Hawthorn]
Melbourne Centre for Nanofabrication [MCN]
Laboratoire Ondes et Matière d'Aquitaine [LOMA]
< Leer menos
Centre for Micro-Photonics [Hawthorn]
Melbourne Centre for Nanofabrication [MCN]
Laboratoire Ondes et Matière d'Aquitaine [LOMA]
Idioma
en
Article de revue
Este ítem está publicado en
Nanofabrication. 2015, vol. 2, n° 1, p. 54-62
De Gruyter
Resumen en inglés
Focused ion beam (FIB) milling with a 10 nm resolution is used to directly write metallic metasurfaces and micro-optical elements capable to create structured light fields. Surface density of fabricated nano-features, their ...Leer más >
Focused ion beam (FIB) milling with a 10 nm resolution is used to directly write metallic metasurfaces and micro-optical elements capable to create structured light fields. Surface density of fabricated nano-features, their edge steepness as well as ion implantation extension around the cut line depend on the ion beam intensity profile. The FIB beam intensity cross section was evaluated using atomic force microscopy (AFM) scans of milled line arrays on a thin Pt film. Approximation of two Gaussian intensity distributions describes the actual beam profile composed of central high intensity part and peripheral wings. FIB fabrication reaching aspect ratio of 10 in gold film is demonstrated.< Leer menos
Palabras clave en inglés
Ga ion beam milling
Nanofabrication
structured light
Proyecto ANR
Initiative d'excellence de l'Université de Bordeaux
Orígen
Importado de HalCentros de investigación