OPTICAL AMMETER FOR INTEGRATED-CIRCUIT CHARACTERIZATION AND FAILURE ANALYSIS
Idioma
en
Article de revue
Este ítem está publicado en
Quality and Reliability Engineering International. 1995, vol. 11, n° 4, p. 247-251
Wiley
Resumen en inglés
The current which flows through the metal semiconductor interface of an ohmic contact produces a Peltier effect. This thermal effect has been optically detected and used for the development of an optical ammeter, the ...Leer más >