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hal.structure.identifierCentre de physique moléculaire optique et hertzienne [CPMOH]
dc.contributor.authorDILHAIRE, S.
hal.structure.identifierCentre de physique moléculaire optique et hertzienne [CPMOH]
dc.contributor.authorJOREZ, S.
hal.structure.identifierLaboratoire FYAM
dc.contributor.authorCORNET, A.
hal.structure.identifierCentre de physique moléculaire optique et hertzienne [CPMOH]
dc.contributor.authorLOPEZ, L. D. P.
hal.structure.identifierCentre de physique moléculaire optique et hertzienne [CPMOH]
dc.contributor.authorCLAEYS, W.
dc.date.issued2000-08
dc.identifier.issn0026-2714
dc.description.abstractEnThis paper deals with the optical measurement of strain in electronic power devices under normal operating conditions. This non-contact and non-invasive method called shearography is based upon speckle interferometry. The technique developed produces images of normal displacement gradient of devices. Numerical processing allows the determination of the surface displacement and its related strain. The main advantages of the measuring tool are to be a simple optical set-up, to be very robust with a good sensitivity and to measure directly strain. Therefore, it is well suited to fit into an industrial environment.
dc.language.isoen
dc.publisherElsevier
dc.title.enMeasurement of the thermomechanical strain of electronic devices by shearography
dc.typeArticle de revue
dc.identifier.doi10.1016/S0026-2714(00)00124-4
dc.subject.halPhysique [physics]
bordeaux.journalMicroelectronics Reliability
bordeaux.page1509-1514
bordeaux.volume40
bordeaux.issue8-10
bordeaux.peerReviewedoui
hal.identifierhal-01550495
hal.version1
hal.popularnon
hal.audienceInternationale
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-01550495v1
bordeaux.COinSctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Microelectronics%20Reliability&rft.date=2000-08&rft.volume=40&rft.issue=8-10&rft.spage=1509-1514&rft.epage=1509-1514&rft.eissn=0026-2714&rft.issn=0026-2714&rft.au=DILHAIRE,%20S.&JOREZ,%20S.&CORNET,%20A.&LOPEZ,%20L.%20D.%20P.&CLAEYS,%20W.&rft.genre=article


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