Using temperature as observable of the frequency response of RF CMOS amplifiers
| hal.structure.identifier | Department of Electronic Engineering | |
| dc.contributor.author | ALDRETE-VIDRIO, E. | |
| hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
| dc.contributor.author | SALHI, M. A. | |
| hal.structure.identifier | Department of Electronic Engineering | |
| dc.contributor.author | ALTET, J. | |
| hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
| dc.contributor.author | GRAUBY, Stéphane | |
| hal.structure.identifier | Department of Electronic Engineering | |
| dc.contributor.author | MATEO, D. | |
| hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
| dc.contributor.author | MICHEL, H. | |
| hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
| dc.contributor.author | CLERJAUD, L. | |
| hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
| dc.contributor.author | RAMPNOUX, Jean-Michel | |
| hal.structure.identifier | Department of Electronic Engineering | |
| dc.contributor.author | RUBIO, A. | |
| hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
| dc.contributor.author | CLAEYS, W. | |
| hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
| dc.contributor.author | DILHAIRE, Stefan | |
| dc.date.issued | 2008 | |
| dc.date.conference | 2008-05-25 | |
| dc.description.abstractEn | The power dissipated by the devices of an integrated circuit can be considered a signature of the circuit's performance. Without disturbing the circuit operation, this power consumption can be monitored by temperature measurements on the silicon surface. In this paper, the frequency response of a RF LNA is observed by measuring spectral components of the sensed temperature. Results prove that temperature can be used to debug and observe figures of merit of analog blocks in a RFIC. Experimental measurements have been done in a 0.25 mum CMOS process. Laser probing techniques have been used as temperature sensors; specifically, a thermoreflectometer and a Michaelson interferometer. | |
| dc.language.iso | en | |
| dc.source.title | 2008 13th European Test Symposium | |
| dc.subject.en | Frequency response | |
| dc.subject.en | Radio frequency | |
| dc.subject.en | Radiofrequency amplifiers | |
| dc.subject.en | Temperature sensors | |
| dc.subject.en | Temperature measurement | |
| dc.subject.en | Circuit optimization | |
| dc.subject.en | Energy consumption | |
| dc.subject.en | Silicon | |
| dc.subject.en | Frequency measurement | |
| dc.subject.en | Integrated circuit measurements | |
| dc.title.en | Using temperature as observable of the frequency response of RF CMOS amplifiers | |
| dc.type | Communication dans un congrès | |
| dc.identifier.doi | 10.1109/ets.2008.15 | |
| dc.subject.hal | Physique [physics] | |
| bordeaux.page | 47-52 | |
| bordeaux.country | IT | |
| bordeaux.title.proceeding | 2008 13th European Test Symposium | |
| bordeaux.conference.city | Verbania | |
| bordeaux.peerReviewed | non | |
| hal.identifier | hal-01840908 | |
| hal.version | 1 | |
| hal.invited | non | |
| hal.proceedings | non | |
| hal.conference.end | 2008-05-29 | |
| hal.popular | non | |
| hal.audience | Internationale | |
| hal.origin.link | https://hal.archives-ouvertes.fr//hal-01840908v1 | |
| bordeaux.COinS | ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.btitle=2008%2013th%20European%20Test%20Symposium&rft.date=2008&rft.spage=47-52&rft.epage=47-52&rft.au=ALDRETE-VIDRIO,%20E.&SALHI,%20M.%20A.&ALTET,%20J.&GRAUBY,%20St%C3%A9phane&MATEO,%20D.&rft.genre=unknown |
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