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Influence of a rough thin layer on the steady-state potential

hal.structure.identifierInstitut Camille Jordan [ICJ]
dc.contributor.authorCIUPERCA, Ionel Sorin
hal.structure.identifierInstitut Camille Jordan [ICJ]
hal.structure.identifierCentre de génie électrique de Lyon [CEGELY]
hal.structure.identifierAmpère [AMPERE]
dc.contributor.authorPERRUSSEL, Ronan
hal.structure.identifierModélisation, contrôle et calcul [MC2]
hal.structure.identifierInstitut de Mathématiques de Bordeaux [IMB]
dc.contributor.authorPOIGNARD, Clair
dc.date.created2009
dc.date.issued2009
dc.description.abstractEnIn this paper, we study the behavior of the steady-state voltage potentials in a material composed by an interior medium surrounded by a rough thin layer and embedded in an ambient bounded medium. The roughness of the layer is supposed to be $\eps$--periodic, $\eps$ being the small thickness of the layer. We present and validate numerically the rigorous approximate transmissions proved by Ciuperca, Jai and Poignard. This paper extends previous works in which the layer had a constant thickness.
dc.language.isoen
dc.subject.enAsymptotic analysis
dc.subject.enFinite Element Method
dc.subject.enLaplace equations
dc.title.enInfluence of a rough thin layer on the steady-state potential
dc.typeRapport
dc.subject.halMathématiques [math]/Equations aux dérivées partielles [math.AP]
bordeaux.page11
bordeaux.type.institutionINRIA
bordeaux.type.reportrr
hal.identifierinria-00384198
hal.version1
hal.audienceNon spécifiée
hal.origin.linkhttps://hal.archives-ouvertes.fr//inria-00384198v1
bordeaux.COinSctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.date=2009&rft.spage=11&rft.epage=11&rft.au=CIUPERCA,%20Ionel%20Sorin&PERRUSSEL,%20Ronan&POIGNARD,%20Clair&rft.genre=unknown


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