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Preparation and characterization of germanium oxysulfide glassy films for optics

hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorMAUREL, Clément
hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorCARDINAL, Thierry
hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorVINATIER, Philippe
hal.structure.identifierSchool of Materials Science and Engineering
dc.contributor.authorPETIT, Laëtitia
hal.structure.identifierSchool of Materials Science and Engineering
dc.contributor.authorRICHARDSON, Kathleen
hal.structure.identifierSchool of Materials Science and Engineering
dc.contributor.authorCARLIE, N.
hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorGUILLEN, François
hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorLAHAYE, Michel
hal.structure.identifierInstitut des Sciences Moléculaires [ISM]
dc.contributor.authorCOUZI, Michel
hal.structure.identifierInstitut des Sciences Moléculaires [ISM]
dc.contributor.authorADAMIETZ, Frédéric
hal.structure.identifierInstitut des Sciences Moléculaires [ISM]
dc.contributor.authorRODRIGUEZ, Vincent
hal.structure.identifierInstitut des Sciences Moléculaires [ISM]
dc.contributor.authorLAGUGNE-LABARTHET, François
hal.structure.identifierInstitut des Sciences Chimiques de Rennes [ISCR]
dc.contributor.authorNAZABAL, Virginie
hal.structure.identifierCentre de physique moléculaire optique et hertzienne [CPMOH]
dc.contributor.authorROYON, Arnaud
hal.structure.identifierCentre de physique moléculaire optique et hertzienne [CPMOH]
dc.contributor.authorCANIONI, Lionel
dc.date.issued2008
dc.identifier.issn0025-5408
dc.description.abstractEnHomogeneous amorphous films in the GeS2-GeO2 system have been deposited by a rf sputtering technique. Optical characterizations have shown that the cut-off wavelength and the linear indices increase with an increase in the S/O ratio. Raman spectroscopy indicates the presence of new modes that can be assigned to intermediate germanium oxysulfide structural units. Photo-sensitivity of the oxysulfide films has been demonstrated for irradiation near the band-gap. Diffraction gratings inscribed using 488 nm exposure displayed a limited diffraction efficiency (≤3%) that weakens with a corresponding decrease in the glass S/O ratio.
dc.language.isoen
dc.publisherElsevier
dc.subject.enGlasses
dc.subject.enThin films
dc.subject.enRaman spectroscopy
dc.subject.enOptical properties
dc.title.enPreparation and characterization of germanium oxysulfide glassy films for optics
dc.typeArticle de revue
dc.identifier.doi10.1016/j.materresbull.2007.05.032
dc.subject.halChimie/Matériaux
bordeaux.journalMaterials Research Bulletin
bordeaux.page1179-1187
bordeaux.volume43
bordeaux.issue5
bordeaux.peerReviewedoui
hal.identifierhal-00267763
hal.version1
hal.popularnon
hal.audienceInternationale
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-00267763v1
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