Third-harmonic generation microscopy for material characterization
| hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
| dc.contributor.author | ROYON, Arnaud | |
| hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
| dc.contributor.author | BOUSQUET, Bruno | |
| hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
| dc.contributor.author | CANIONI, Lionel | |
| hal.structure.identifier | Institut de Chimie de la Matière Condensée de Bordeaux [ICMCB] | |
| dc.contributor.author | TRÉGUER-DELAPIERRE, Mona | |
| hal.structure.identifier | Institut de Chimie de la Matière Condensée de Bordeaux [ICMCB] | |
| dc.contributor.author | CARDINAL, Thierry | |
| hal.structure.identifier | Institut de Chimie de la Matière Condensée de Bordeaux [ICMCB] | |
| dc.contributor.author | FARGIN, Evelyne | |
| hal.structure.identifier | National Research Laboratory of Nonlinear Optics | |
| dc.contributor.author | KIM, Dae-Geun | |
| hal.structure.identifier | National Research Laboratory of Nonlinear Optics | |
| dc.contributor.author | PARK, Seung-Han | |
| dc.date.issued | 2006 | |
| dc.identifier.issn | 1226-4776 | |
| dc.description.abstractEn | Third harmonic generation microscopy is described in the frame work of the theory of harmonic generation with Gaussian focused beams inside a bulk material as well as at the vicinity of an interface. This model is then applied to characterize different types of materials in terms of electronic third-order susceptibility. Examples of bulk glasses, poled glasses, laser-induced modifications in glasses and nanoparticles in solution are given in order to give a survey of the broad application field of THG microscopy in material characterization. | |
| dc.language.iso | en | |
| dc.publisher | Optical Society of Korea | |
| dc.subject.en | Third harmonic generation | |
| dc.subject.en | Microscopy | |
| dc.subject.en | Materials | |
| dc.title.en | Third-harmonic generation microscopy for material characterization | |
| dc.type | Article de revue | |
| dc.identifier.doi | 10.3807/JOSK.2006.10.4.188 | |
| dc.subject.hal | Chimie/Matériaux | |
| bordeaux.journal | Journal of the Optical Society of Korea | |
| bordeaux.page | 188-195 | |
| bordeaux.volume | 10 | |
| bordeaux.issue | 4 | |
| bordeaux.peerReviewed | oui | |
| hal.identifier | hal-00326989 | |
| hal.version | 1 | |
| hal.popular | non | |
| hal.audience | Internationale | |
| hal.origin.link | https://hal.archives-ouvertes.fr//hal-00326989v1 | |
| bordeaux.COinS | ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Journal%20of%20the%20Optical%20Society%20of%20Korea&rft.date=2006&rft.volume=10&rft.issue=4&rft.spage=188-195&rft.epage=188-195&rft.eissn=1226-4776&rft.issn=1226-4776&rft.au=ROYON,%20Arnaud&BOUSQUET,%20Bruno&CANIONI,%20Lionel&TR%C3%89GUER-DELAPIERRE,%20Mona&CARDINAL,%20Thierry&rft.genre=article |
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