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hal.structure.identifierCentre de physique moléculaire optique et hertzienne [CPMOH]
hal.structure.identifierLaboratoire des Composants pour la Récupération d'Énergies [LCRE]
dc.contributor.authorPUYOO, Etienne
hal.structure.identifierCentre de physique moléculaire optique et hertzienne [CPMOH]
dc.contributor.authorGRAUBY, Stéphane
hal.structure.identifierCentre de physique moléculaire optique et hertzienne [CPMOH]
dc.contributor.authorRAMPNOUX, Jean-Michel
hal.structure.identifierLaboratoire des Composants pour la Récupération d'Énergies [LCRE]
hal.structure.identifierLaboratoire Composants Hybrides [LCH]
dc.contributor.authorROUVIÈRE, Emmanuelle
hal.structure.identifierCentre de physique moléculaire optique et hertzienne [CPMOH]
dc.contributor.authorDILHAIRE, Stefan
dc.date.created2010-03-26
dc.date.issued2010-07-02
dc.identifier.issn0034-6748
dc.description.abstractEnIn scanning thermal microscopy (SThM) techniques, the thermal exchange radius between tip and sample is a crucial parameter. Indeed, it limits the lateral spatial resolution but, in addition, an accurate value of this parameter is necessary for a precise identification of thermal properties. But until now, the thermal exchange radius is usually estimated but not measured. This paper presents an experimental procedure, based on the 3ω-SThM method, to measure its value. We apply this procedure to evaluate the thermal exchange radius of two commercial probes: the well-known Wollaston one and a new probe constituted of a palladium film on a SiO2 substrate. Finally, presenting silicon nanowire images, we clearly demonstrate that this new probe can reach a spatial resolution better than 100 nm whereas the Wollaston probe hardly reaches a submicronic spatial resolution.
dc.language.isoen
dc.publisherAmerican Institute of Physics
dc.title.enThermal exchange radius measurement: Application to nanowire thermal imaging
dc.typeArticle de revue
dc.identifier.doi10.1063/1.3455214
bordeaux.journalReview of Scientific Instruments
bordeaux.page073701 (1-5)
bordeaux.volume81
bordeaux.issue7
bordeaux.peerReviewedoui
hal.identifierhal-00505488
hal.version1
hal.popularnon
hal.audienceInternationale
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-00505488v1
bordeaux.COinSctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Review%20of%20Scientific%20Instruments&rft.date=2010-07-02&rft.volume=81&rft.issue=7&rft.spage=073701%20(1-5)&rft.epage=073701%20(1-5)&rft.eissn=0034-6748&rft.issn=0034-6748&rft.au=PUYOO,%20Etienne&GRAUBY,%20St%C3%A9phane&RAMPNOUX,%20Jean-Michel&ROUVI%C3%88RE,%20Emmanuelle&DILHAIRE,%20Stefan&rft.genre=article


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