Thermal characterization of diamond films through modulated photothermal radiometry.
Langue
en
Article de revue
Ce document a été publié dans
ACS Applied Materials & Interfaces. 2014-02-12, vol. 6, n° 3, p. 2095-2102
Washington, D.C. : American Chemical Society
Résumé en anglais
Diamond (Dia) films are promising heat-dissipative materials for electronic packages because they combine high thermal conductivity with high electrical resistivity. However, precise knowledge of the thermal properties of ...Lire la suite >
Diamond (Dia) films are promising heat-dissipative materials for electronic packages because they combine high thermal conductivity with high electrical resistivity. However, precise knowledge of the thermal properties of the diamond films is crucial to their potential application as passive thermal management substrates in electronics. In this study, modulated photothermal radiometry in a front-face configuration was employed to thermally characterize polycrystalline diamond films deposited onto silicon (Si) substrates through laser-assisted combustion synthesis. The intrinsic thermal conductivity of diamond films and the thermal boundary resistance at the interface between the diamond film and the Si substrate were investigated. The results enlighten the correlation between the deposition process, film purity, film transverse thermal conductivity, and interface thermal resistance.< Réduire
Mots clés en anglais
Diamond films
Laser-assisted combustion synthesis
Interface
Heat conduction
Origine
Importé de halUnités de recherche