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hal.structure.identifierGREMAN (matériaux, microélectronique, acoustique et nanotechnologies) [GREMAN - UMR 7347]
dc.contributor.authorAUTRET-LAMBERT, C.
hal.structure.identifierGREMAN (matériaux, microélectronique, acoustique et nanotechnologies) [GREMAN - UMR 7347]
dc.contributor.authorPIGNON, B.
hal.structure.identifierGREMAN (matériaux, microélectronique, acoustique et nanotechnologies) [GREMAN - UMR 7347]
dc.contributor.authorGERVAIS, M.
hal.structure.identifierGREMAN (matériaux, microélectronique, acoustique et nanotechnologies) [GREMAN - UMR 7347]
dc.contributor.authorMONOT-LAFFEZ, I.
hal.structure.identifierGREMAN (matériaux, microélectronique, acoustique et nanotechnologies) [GREMAN - UMR 7347]
dc.contributor.authorRUYTER, A.
hal.structure.identifierGREMAN (matériaux, microélectronique, acoustique et nanotechnologies) [GREMAN - UMR 7347]
dc.contributor.authorAMMOR, L.
hal.structure.identifierGREMAN (matériaux, microélectronique, acoustique et nanotechnologies) [GREMAN - UMR 7347]
dc.contributor.authorGERVAIS, François
hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorBASSAT, Jean-Marc.
hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorDECOURT, Rodolphe
dc.date.issued2006
dc.identifier.issn0022-4596
dc.description.abstractEnX-ray powder diffraction and resistivity measurements were performed on Bi2Sr2CaCu2O8+δ ceramics substituted by Y and Zn for Ca and Cu sites, respectively. X-ray diffraction patterns show an incommensurate modulated structure along the b-axis. The structural refinements were carried out using the four-dimensional space group Bbmb(0β1)0 0 0. From the X-ray peak profiles analysis, an anisotropic line-shape broadening was observed. The use of the “Williamson and Hall” method allows distinguishing the origin of broadening as mainly due to microstrains. A large transition from a metallic to semiconductor behaviour is observed on the resistivity curves at x≈0.4 for Bi2Sr2Ca1−xYxCu2O8+δ and at x′≈0.36 for Bi2Sr2Ca1−xYxCu1.94Zn0.06O8+δ, which can be also correlated to the defects. Oppositely to the metallic behaviour, which satisfies the Mathiessen's rule, the semiconducting one can be modelled by a variable range hopping process.
dc.language.isoen
dc.publisherElsevier
dc.subject.enBi-based cuprates
dc.subject.enX-ray diffraction
dc.subject.enExperimental determination of defects by diffraction
dc.subject.enTransport properties
dc.title.enMicrostructural and transport properties in substituted Bi2Sr2CaCu2O8+δ-modulated compounds
dc.typeArticle de revue
dc.identifier.doi10.1016/j.jssc.2006.03.005
dc.subject.halChimie/Matériaux
bordeaux.journalJournal of Solid State Chemistry
bordeaux.pagep. 1698-1706
bordeaux.volumevol. 179, n° 6
bordeaux.peerReviewedoui
hal.identifierhal-00110240
hal.version1
hal.popularnon
hal.audienceNon spécifiée
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-00110240v1
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