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hal.structure.identifierPhysics Department
dc.contributor.authorDI GIROLAMO, Salvatore
hal.structure.identifierPhysics Department
dc.contributor.authorKAMSHILIN, Alexei A.
hal.structure.identifierOptoelectronics Laboratory
dc.contributor.authorROMASHKO, Roman V.
hal.structure.identifierOptoelectronics Laboratory
dc.contributor.authorKULCHIN, Yuri N.
hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorLAUNAY, Jean-Claude
dc.date.issued2007
dc.identifier.issn1094-4087
dc.description.abstractEnWe present an adaptive interferometer based on the reflection dynamic hologram recorded in photorefractive CdTe:V crystal with no external electric field. Linear phase-to-intensity transformation is achieved by vectorial mixing of two waves with different polarization states ( linear and elliptical) in the anisotropic diffraction geometry. Comparison of reflection and transmission geometries considering both sensitivity and adaptability is carried out. It is shown that the reflection geometry is characterized by better combination of these parameters provided that the crystal possesses high enough concentration of photorefractive centers.
dc.language.isoen
dc.publisherOptical Society of America - OSA Publishing
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/
dc.subject.enInstrumentation
dc.subject.enInterferometer
dc.subject.enPhase measurement
dc.subject.enNonlinear optics
dc.subject.enTwo-wave mixing
dc.subject.enCdTe:V
dc.title.enFast adaptative interferometer on dynamic reflection hologram in CdTe:V
dc.typeArticle de revue
dc.identifier.doi10.1364/OE.15.000545
dc.subject.halChimie/Matériaux
bordeaux.journalOptics Express
bordeaux.page545-555
bordeaux.volume15
bordeaux.issue2
bordeaux.peerReviewedoui
hal.identifierhal-00126667
hal.version1
hal.popularnon
hal.audienceInternationale
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-00126667v1
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