Durability study of a fluorescent optical memory in glass studied by luminescence spectroscopy
| hal.structure.identifier | Laboratoire Ondes et Matière d'Aquitaine [LOMA] | |
| hal.structure.identifier | Laboratoire de l'intégration, du matériau au système [IMS] | |
| dc.contributor.author | ROYON, Arnaud | |
| hal.structure.identifier | Institut de Chimie de la Matière Condensée de Bordeaux [ICMCB] | |
| dc.contributor.author | BOURHIS, Kevin | |
| hal.structure.identifier | Laboratoire Ondes et Matière d'Aquitaine [LOMA] | |
| dc.contributor.author | BÉCHOU, Laurent | |
| hal.structure.identifier | Institut de Chimie de la Matière Condensée de Bordeaux [ICMCB] | |
| dc.contributor.author | CARDINAL, Thierry | |
| hal.structure.identifier | Laboratoire Ondes et Matière d'Aquitaine [LOMA] | |
| dc.contributor.author | CANIONI, Lionel | |
| hal.structure.identifier | Laboratoire de l'intégration, du matériau au système [IMS] | |
| dc.contributor.author | DESHAYES, Yannick | |
| dc.date.created | 2013-05-20 | |
| dc.date.issued | 2013-09 | |
| dc.identifier.issn | 0026-2714 | |
| dc.description.abstractEn | Thermal stress at 100 °C for more than 3168 h of a fluorescent optical memory composed of laser written silver nano clusters embedded in glass has been performed. Measurements of luminescence spectra have been carried out at different times, showing a decreasing and an increasing evolution of the red and the blue part of the spectrum, respectively. This evolution has been attributed to the diffusion and the reorganization of different silver species inside the matrix, altering the internal electric field. Stark effect based modeling enables the degradation mode of the memory. | |
| dc.language.iso | en | |
| dc.publisher | Elsevier | |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-sa/ | |
| dc.subject.en | Relability | |
| dc.subject.en | femtosecond laser | |
| dc.subject.en | data storage | |
| dc.subject.en | optical memory | |
| dc.title.en | Durability study of a fluorescent optical memory in glass studied by luminescence spectroscopy | |
| dc.type | Article de revue | |
| dc.identifier.doi | 10.1016/j.microrel.2013.07.110 | |
| dc.subject.hal | Physique [physics]/Physique [physics]/Optique [physics.optics] | |
| bordeaux.journal | Microelectronics Reliability | |
| bordeaux.page | 1514-1518 | |
| bordeaux.volume | 53 | |
| bordeaux.issue | 9-11 | |
| bordeaux.peerReviewed | oui | |
| hal.identifier | hal-00932228 | |
| hal.version | 1 | |
| hal.popular | non | |
| hal.audience | Internationale | |
| hal.origin.link | https://hal.archives-ouvertes.fr//hal-00932228v1 | |
| bordeaux.COinS | ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Microelectronics%20Reliability&rft.date=2013-09&rft.volume=53&rft.issue=9-11&rft.spage=1514-1518&rft.epage=1514-1518&rft.eissn=0026-2714&rft.issn=0026-2714&rft.au=ROYON,%20Arnaud&BOURHIS,%20Kevin&B%C3%89CHOU,%20Laurent&CARDINAL,%20Thierry&CANIONI,%20Lionel&rft.genre=article |
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