Durability study of a fluorescent optical memory in glass studied by luminescence spectroscopy
ROYON, Arnaud
Laboratoire Ondes et Matière d'Aquitaine [LOMA]
Laboratoire de l'intégration, du matériau au système [IMS]
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Laboratoire Ondes et Matière d'Aquitaine [LOMA]
Laboratoire de l'intégration, du matériau au système [IMS]
ROYON, Arnaud
Laboratoire Ondes et Matière d'Aquitaine [LOMA]
Laboratoire de l'intégration, du matériau au système [IMS]
< Reduce
Laboratoire Ondes et Matière d'Aquitaine [LOMA]
Laboratoire de l'intégration, du matériau au système [IMS]
Language
en
Article de revue
This item was published in
Microelectronics Reliability. 2013-09, vol. 53, n° 9-11, p. 1514-1518
Elsevier
English Abstract
Thermal stress at 100 °C for more than 3168 h of a fluorescent optical memory composed of laser written silver nano clusters embedded in glass has been performed. Measurements of luminescence spectra have been carried out ...Read more >
Thermal stress at 100 °C for more than 3168 h of a fluorescent optical memory composed of laser written silver nano clusters embedded in glass has been performed. Measurements of luminescence spectra have been carried out at different times, showing a decreasing and an increasing evolution of the red and the blue part of the spectrum, respectively. This evolution has been attributed to the diffusion and the reorganization of different silver species inside the matrix, altering the internal electric field. Stark effect based modeling enables the degradation mode of the memory.Read less <
English Keywords
Relability
femtosecond laser
data storage
optical memory
Origin
Hal imported