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hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorMAUVY, Fabrice
hal.structure.identifierCentre interuniversitaire de recherche et d'ingénierie des matériaux [CIRIMAT]
dc.contributor.authorLENORMAND, P.
hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorLALANNE, Cécile
hal.structure.identifierCentre interuniversitaire de recherche et d'ingénierie des matériaux [CIRIMAT]
dc.contributor.authorANSART, Florence
hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorBASSAT, Jean-Marc.
hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorGRENIER, Jean-Claude
dc.date.issued2007
dc.identifier.issn0378-7753
dc.description.abstractEnYttria stabilized zirconia (YSZ, 8% Y2O3) thick films were coated on dense alumina substrates by a dip-coating process. The suspension was obtained by addition of a polymeric matrix in a stable suspension of commercial YSZ (Tosoh) powders dispersed in an azeotropic mixture MEK-EtOH. The suspension composition was improved by the addition of YSZ Tosoh particles encapsulated by zirconium alkoxide sol containing yttrium nitrate which are the precursors of the 8-YSZ oxide. This optimal formulation allowed preparing, via a dip-coating process, thick films which were, after thermal treatment, homogeneous, dense and crack-free. A specific method was performed to measure the electrical conductivity, i.e. to determine the ionic conductivity of the film: it uses the four-point probe technique combined with ac impedance spectroscopy. The good agreement between the classical two-electrode measurements performed on YSZ pellets and the four-electrode ones performed on YSZ films allows concluding that this method is relevant for characterizing the transport properties of thick films.
dc.language.isoen
dc.publisherElsevier
dc.subject.enFour-point probe conductivity measurements
dc.subject.enSol-gel processes
dc.subject.enThick films
dc.subject.enYSZ ionic conductivity
dc.title.enElectrochemical characterization of YSZ thick films deposited by dip-coating process
dc.typeArticle de revue
dc.identifier.doi10.1016/j.jpowsour.2007.06.061
dc.subject.halChimie/Matériaux
bordeaux.journalJournal of Power Sources
bordeaux.page783-788
bordeaux.volume171
bordeaux.issue2
bordeaux.peerReviewedoui
hal.identifierhal-00179712
hal.version1
hal.popularnon
hal.audienceInternationale
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-00179712v1
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