Electrochemical characterization of YSZ thick films deposited by dip-coating process
hal.structure.identifier | Institut de Chimie de la Matière Condensée de Bordeaux [ICMCB] | |
dc.contributor.author | MAUVY, Fabrice | |
hal.structure.identifier | Centre interuniversitaire de recherche et d'ingénierie des matériaux [CIRIMAT] | |
dc.contributor.author | LENORMAND, P. | |
hal.structure.identifier | Institut de Chimie de la Matière Condensée de Bordeaux [ICMCB] | |
dc.contributor.author | LALANNE, Cécile | |
hal.structure.identifier | Centre interuniversitaire de recherche et d'ingénierie des matériaux [CIRIMAT] | |
dc.contributor.author | ANSART, Florence | |
hal.structure.identifier | Institut de Chimie de la Matière Condensée de Bordeaux [ICMCB] | |
dc.contributor.author | BASSAT, Jean-Marc. | |
hal.structure.identifier | Institut de Chimie de la Matière Condensée de Bordeaux [ICMCB] | |
dc.contributor.author | GRENIER, Jean-Claude | |
dc.date.issued | 2007 | |
dc.identifier.issn | 0378-7753 | |
dc.description.abstractEn | Yttria stabilized zirconia (YSZ, 8% Y2O3) thick films were coated on dense alumina substrates by a dip-coating process. The suspension was obtained by addition of a polymeric matrix in a stable suspension of commercial YSZ (Tosoh) powders dispersed in an azeotropic mixture MEK-EtOH. The suspension composition was improved by the addition of YSZ Tosoh particles encapsulated by zirconium alkoxide sol containing yttrium nitrate which are the precursors of the 8-YSZ oxide. This optimal formulation allowed preparing, via a dip-coating process, thick films which were, after thermal treatment, homogeneous, dense and crack-free. A specific method was performed to measure the electrical conductivity, i.e. to determine the ionic conductivity of the film: it uses the four-point probe technique combined with ac impedance spectroscopy. The good agreement between the classical two-electrode measurements performed on YSZ pellets and the four-electrode ones performed on YSZ films allows concluding that this method is relevant for characterizing the transport properties of thick films. | |
dc.language.iso | en | |
dc.publisher | Elsevier | |
dc.subject.en | Four-point probe conductivity measurements | |
dc.subject.en | Sol-gel processes | |
dc.subject.en | Thick films | |
dc.subject.en | YSZ ionic conductivity | |
dc.title.en | Electrochemical characterization of YSZ thick films deposited by dip-coating process | |
dc.type | Article de revue | |
dc.identifier.doi | 10.1016/j.jpowsour.2007.06.061 | |
dc.subject.hal | Chimie/Matériaux | |
bordeaux.journal | Journal of Power Sources | |
bordeaux.page | 783-788 | |
bordeaux.volume | 171 | |
bordeaux.issue | 2 | |
bordeaux.peerReviewed | oui | |
hal.identifier | hal-00179712 | |
hal.version | 1 | |
hal.popular | non | |
hal.audience | Internationale | |
hal.origin.link | https://hal.archives-ouvertes.fr//hal-00179712v1 | |
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