A combined EPR and modulated photocurrent study of native defects in Bridgman grown vanadium doped cadmium telluride : the case of the tellurium antisite
Langue
en
Article de revue
Ce document a été publié dans
Semiconductor Science and Technolgoy. 2003, vol. 18, n° 11, p. 919-926
Résumé en anglais
The electrical and photoconductive properties of Bridgman grown vanadium–zinc co-doped CdTe bulk crystals are strongly influenced by one native intrinsic defect previously attributed to the Te vacancy. In order to identify ...Lire la suite >
Mots clés en anglais
Crystal growth
Bridgman method
Vanadium
Calcium telluride
Antisite
Modulated photocurrent
Electron paramagnetic resonance