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In situ imaging and control of layer-by-layer femtosecond laser thinning of graphene.

hal.structure.identifierDepartment of Electrical Engineering
dc.contributor.authorLI, Da Wei
hal.structure.identifierDepartment of Electrical Engineering
dc.contributor.authorZHOU, Yun Shen
hal.structure.identifierDepartment of Electrical Engineering
dc.contributor.authorHUANG, Xi
hal.structure.identifierSchool of Mechanical Engineering
dc.contributor.authorJIANG, Lan
hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorSILVAIN, Jean-François
hal.structure.identifierDepartment of Electrical Engineering
dc.contributor.authorLU, Yong Feng
dc.date.issued2015
dc.identifier.issn2040-3364
dc.description.abstractEnAlthough existing methods (chemical vapor deposition, mechanical exfoliation, etc.) are available to produce graphene, the lack of thickness control limits further graphene applications. In this study, we demonstrate an approach to precisely thin graphene films to a specific thickness using femtosecond (fs) laser raster scanning. By using appropriate laser fluence and scanning times, graphene thinning with an atomic layer precision, namely layer-by-layer graphene removal, has been realized. The fs laser used was configured in a four-wave mixing (FWM) system which can be used to distinguish graphene layer thickness and count the number of layers using the linear relationship between the FWM signal intensity and the graphene thickness. Furthermore, FWM imaging has been successfully applied to achieve in situ, real-time monitoring of the fs laser graphene thinning process. This method can not only realize the large-scale thinning of graphene with atomic layer precision, but also provide in situ, rapid imaging capability of graphene for an accurate assessment of the number of layers.
dc.language.isoen
dc.publisherRoyal Society of Chemistry
dc.title.enIn situ imaging and control of layer-by-layer femtosecond laser thinning of graphene.
dc.typeArticle de revue
dc.identifier.doi10.1039/C4NR07078J
dc.subject.halChimie/Matériaux
bordeaux.journalNanoscale
bordeaux.page3651-3659
bordeaux.volume7
bordeaux.issue8
bordeaux.peerReviewedoui
hal.identifierhal-01132519
hal.version1
hal.popularnon
hal.audienceInternationale
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-01132519v1
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