Third-harmonic generation microscopy for material characterization
Langue
en
Article de revue
Ce document a été publié dans
Journal of the Optical Society of Korea. 2006, vol. 10, n° 4, p. 188-195
Optical Society of Korea
Résumé en anglais
Third harmonic generation microscopy is described in the frame work of the theory of harmonic generation with Gaussian focused beams inside a bulk material as well as at the vicinity of an interface. This model is then ...Lire la suite >
Third harmonic generation microscopy is described in the frame work of the theory of harmonic generation with Gaussian focused beams inside a bulk material as well as at the vicinity of an interface. This model is then applied to characterize different types of materials in terms of electronic third-order susceptibility. Examples of bulk glasses, poled glasses, laser-induced modifications in glasses and nanoparticles in solution are given in order to give a survey of the broad application field of THG microscopy in material characterization.< Réduire
Mots clés en anglais
Third harmonic generation
Microscopy
Materials
Origine
Importé de halUnités de recherche