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hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorMICHAU, Dominique
hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorSIMON, Annie
hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorMAGLIONE, Mario
dc.date.issued2009
dc.identifier.issn0022-3727
dc.description.abstractEnWe have processed Ba<sub>1+<i>x</i>/2</sub>LaNb<sub>5-<i>x</i></sub>Ti<sub><i>x</i></sub>O<sub>15</sub> thin films using radio-frequency magnetron sputtering. Using XRD, SEM, x-ray microprobe and RBS, the polycrystalline films have been optimized as to reach the nominal composition. Dielectric experiments have been performed on ceramics and thin films for frequencies between 100 Hz and 5 MHz in the temperature range 100-420 K. In the most stoichiometric films, relaxor behaviour is evidenced whose features are similar to those of ceramics of the same composition. Such an agreement between ceramics and thin films relaxors is only rarely reported in lead-free materials. Moreover, the relaxor state was reported in perovskite films and our present report broadens the range of structures in which it can occur.
dc.language.isoen
dc.publisherIOP Publishing
dc.subject.enDeposition by sputtering
dc.subject.enX-ray diffraction
dc.subject.enPermittivity (dielectric function)
dc.subject.enDielectric loss and relaxation
dc.subject.enDielectric thin films
dc.subject.enScanning electron microscopy
dc.title.enLead-free relaxor thin films of tungsten bronze symmetry
dc.typeArticle de revue
dc.identifier.doi10.1088/0022-3727/42/7/075407
dc.subject.halChimie/Matériaux
bordeaux.journalJournal of Physics D: Applied Physics
bordeaux.page075407 (7 p.)
bordeaux.volume42
bordeaux.issue7
bordeaux.peerReviewedoui
hal.identifierhal-00368390
hal.version1
hal.popularnon
hal.audienceInternationale
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-00368390v1
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