Impact of storage induced outgassing organic contamination on laser induced damage of silica optics at 351 nm
BIEN-AIMÉ, Karell
Centre d'études scientifiques et techniques d'Aquitaine (CESTA-CEA) [CESTA]
Institut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
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Centre d'études scientifiques et techniques d'Aquitaine (CESTA-CEA) [CESTA]
Institut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
BIEN-AIMÉ, Karell
Centre d'études scientifiques et techniques d'Aquitaine (CESTA-CEA) [CESTA]
Institut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
Centre d'études scientifiques et techniques d'Aquitaine (CESTA-CEA) [CESTA]
Institut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
TOVENA-PECAULT, Isabelle
Centre d'études scientifiques et techniques d'Aquitaine (CESTA-CEA) [CESTA]
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Centre d'études scientifiques et techniques d'Aquitaine (CESTA-CEA) [CESTA]
Idioma
en
Article de revue
Este ítem está publicado en
Optics Express. 2009, vol. 17, n° 21, p. 18703-18713
Optical Society of America - OSA Publishing
Resumen en inglés
The impact of storage conditions on laser induced damage density at 351 nm on bare fused polished silica samples has been studied. Intentionally outgassing of polypropylene pieces on silica samples was done. We evidenced ...Leer más >
The impact of storage conditions on laser induced damage density at 351 nm on bare fused polished silica samples has been studied. Intentionally outgassing of polypropylene pieces on silica samples was done. We evidenced an important increase of laser induced damage density on contaminated samples demonstrating that storage could limit optics lifetime performances. Atomic Force Microscopy (AFM) and Gas Chromatography -Mass Spectrometry (GC-MS) have been used to identify the potential causes of this effect. It shows that a small quantity of organic contamination deposited on silica surface is responsible for this degradation. Various hypotheses are proposed to explain the damage mechanism. The more likely hypothesis is a coupling between surface defects of optics and organic contaminants.< Leer menos
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