FOURNIER, Jessica; GRUA, Pierre; NÉAUPORT, Jérôme; FARGIN, Evelyne; JUBERA, Veronique; TALAGA, David; DEL GUERZO, André; RAFFY, Guillaume; JOUANNIGOT, Stéphane

doi:10.1364/OME.3.000001

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FOURNIER, Jessica
Centre d'études scientifiques et techniques d'Aquitaine (CESTA-CEA) [CESTA]
Institut de Chimie de la Matière Condensée de Bordeaux [ICMCB]

GRUA, Pierre
Centre d'études scientifiques et techniques d'Aquitaine (CESTA-CEA) [CESTA]

NÉAUPORT, Jérôme
Centre d'études scientifiques et techniques d'Aquitaine (CESTA-CEA) [CESTA]

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Optical Materials Express. 2013, vol. 3, n° 1, p. 1-10

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In situ temperature dependence of the Photoluminescence under 325nm irradiation is used to investigate defect populations existing in different surface flaws in high purity fused silica. Five photoluminescence bands peaking at 1.9, 2.1, 2.3, 2.63 and 3.11 eV have been detected in the spectral area ranging from 1.6 up to 3.6 eV. The Gaussian deconvolution of spectra allows dividing the five luminescence bands in two categories. The former corresponds to bands showing a significant intensity enhancement while temperature decreases; the latter corresponds to bands remaining insensitive to the temperature evolution. Such a behavior brings new information on defects involved in laser damage mechanism at 351 nm in nanosecond regime.< Leer menos

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Fluorescence microscopy

Laser damage

Glass

Optics

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Temperature dependence of luminescence for different surface flaws in high purity silica glass

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Centros de investigación