TRL-calibration Standards with Emphasis on Crosstalk Reduction
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Este ítem está publicado en
14th Global Symposium on Millimeter-Waves and Terahertz, GSMM 2022, 2022-05-18, Seoul. 2022-05-18
IEEE
Resumen en inglés
We present an innovative “shifted RF Pad” TRL on–wafer calibration kit to minimize the impact of crosstalk. The impact of the crosstalk in on-wafer measurement up to 330 GHz is observable by comparing results of DUTs ...Leer más >
Palabras clave en inglés
S-paramater measurement
Semiconductor Devices
HBT
Sub-THz frequency
THz frequency
on-wafer TRL calibration
calibration kit structures design