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hal.structure.identifierCentre d'Etudes Nucléaires de Bordeaux Gradignan [CENBG]
dc.contributor.authorGUÉGAN, H.
dc.date.issued2007
dc.language.isoen
dc.title.enUse of a nuclear microprobe in electronic device characterization
dc.typeArticle de revue
dc.identifier.doi10.1361/edfa0904p14
dc.subject.halPhysique [physics]/Physique [physics]/Instrumentations et Détecteurs [physics.ins-det]
bordeaux.journalElectronic Device Failure Analysis
bordeaux.page14-19
bordeaux.volume9
bordeaux.peerReviewedoui
hal.identifierin2p3-00321170
hal.version1
hal.popularnon
hal.audienceNon spécifiée
hal.origin.linkhttps://hal.archives-ouvertes.fr//in2p3-00321170v1
bordeaux.COinSctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Electronic%20Device%20Failure%20Analysis&rft.date=2007&rft.volume=9&rft.spage=14-19&rft.epage=14-19&rft.au=GU%C3%89GAN,%20H.&rft.genre=article


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