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hal.structure.identifierInstitut des sciences analytiques et de physico-chimie pour l'environnement et les materiaux [IPREM]
dc.contributor.authorSCHAUMLÖFFEL, Dirk
dc.contributor.authorHUTCHINSON, R.
hal.structure.identifierInstitut des sciences analytiques et de physico-chimie pour l'environnement et les materiaux [IPREM]
dc.contributor.authorMALHERBE, Julien
dc.contributor.authorLE COUSTUMER, Philippe
hal.structure.identifierCentre d'Etudes Nucléaires de Bordeaux Gradignan [CENBG]
dc.contributor.authorGONTIER, E.
hal.structure.identifierInstitut des sciences analytiques et de physico-chimie pour l'environnement et les materiaux [IPREM]
dc.contributor.authorISAURE, M.-P.
dc.date.issued2016
dc.identifier.isbn9783527694907 (ISBN); 9783527339693 (ISBN)
dc.description.abstractEnThis chapter presents four complementary element-specific bioimaging techniques: laser ablation-inductively coupled plasma-mass spectrometry (LA-ICP-MS), nano secondary ion mass spectrometry (NanoSIMS), transmission electron microscopy coupled with energy-dispersive X-ray spectroscopy (TEM/X-EDS), and synchrotron-based X-ray fluorescence (SXRF). LA-ICP-MS is a spatially resolved analytical technique mainly measuring metallic elements in solidmaterials. LA-ICP-MS bioimaging analysis has been applied to cancer studies to investigate metal-ion distribution changes in diseased versus healthy tissues. SIMS is an analytical technique that relies on the sputtering of ions from a solid surface by focused positive or negative primary ion beams and the subsequent analysis of the produced secondary ions by a mass spectrometer under high vacuum. NanoSIMS and TEM/X-EDS are operated under high vacuum where the sample is exposed to a high-energy ion beam or electron beam. These facts demand specific sample preparation strategies for biological samples, which are similar for both techniques and can be regarded together.
dc.language.isoen
dc.publisherWiley-VCH Verlag
dc.source.titleMetallomics Analytical Techniques and Speciation Methods
dc.subject.enSynchrotron-based X-ray fluorescence
dc.subject.enTEM/X-EDS
dc.subject.ennano secondary ion mass spectrometry
dc.subject.enBioimaging techniques
dc.subject.enMetallomics
dc.title.enNovel Methods for Bioimaging Including LA-ICP-MS, NanoSIMS, TEM/X-EDS, and SXRF
dc.typeChapitre d'ouvrage
dc.subject.halChimie
dc.subject.halChimie/Chimie analytique
bordeaux.page83-116
bordeaux.title.proceedingMetallomics Analytical Techniques and Speciation Methods
hal.identifierhal-01529884
hal.version1
hal.popularnon
hal.audienceInternationale
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-01529884v1
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