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dc.rights.licenseopenen_US
hal.structure.identifierInstitut de Mécanique et d'Ingénierie [I2M]
dc.contributor.authorGROZ, Marie-Marthe
IDREF: 228324599
hal.structure.identifierInstitut de Mécanique et d'Ingénierie [I2M]
dc.contributor.authorBENSALEM, Mohamed
hal.structure.identifierInstitut de Mécanique et d'Ingénierie [I2M]
dc.contributor.authorSOMMIER, Alain
hal.structure.identifierInstitut de Mécanique et d'Ingénierie [I2M]
dc.contributor.authorABISSET-CHAVANNE, Emmanuelle
hal.structure.identifierInstitut de Mécanique et d'Ingénierie [I2M]
dc.contributor.authorCHEVALIER, Stéphane
dc.contributor.authorCHULKOV, Arsenii
hal.structure.identifierInstitut de Mécanique et d'Ingénierie [I2M]
dc.contributor.authorBATTAGLIA, Jean-Luc
IDREF: 084712562
hal.structure.identifierInstitut de Mécanique et d'Ingénierie [I2M]
dc.contributor.authorBATSALE, Jean-Christophe
hal.structure.identifierInstitut de Mécanique et d'Ingénierie [I2M]
dc.contributor.authorPRADERE, Christophe
IDREF: 095038132
dc.date.accessioned2021-10-13T13:05:09Z
dc.date.available2021-10-13T13:05:09Z
dc.date.issued2020-03-30
dc.identifier.issn2076-3417en_US
dc.identifier.urioai:crossref.org:10.3390/app10072351
dc.identifier.urihttps://oskar-bordeaux.fr/handle/20.500.12278/112774
dc.description.abstractEnIn this paper, the problem of the quantitative characterization of thermal resistance fields in a multilayer sample is addressed by using the classical front face flash method as the thermal excitation and infrared thermography (IRT) as the monitoring sensor. In this challenging problem, the complete inverse processing of a multilayer analytical model is difficult due to the lack of sensitivity of some parameters (layer thickness, depth of thermal resistance, etc.) and the expansive computational iterative processing. For these reasons, the proposed strategy is to use a simple multilayer problem where only one resistive layer is estimated. Moreover, to simplify the inverse processing often based on iterative methods, an asymptotic development method is proposed here. Regarding the thermal signal reconstruction (TSR) methods, the drawback of these methods is the inability to be quantitative. To overcome this problem, the method incorporates a calibration process originating from the complete analytical quadrupole solution to the thermal problem. This analytical knowledge allows self-calibration of the asymptotic method. From this calibration, the quantitative thermal resistance field of a sample can be retrieved with a reasonable accuracy lower than 5%.
dc.language.isoENen_US
dc.rightsAttribution 3.0 United States*
dc.rights.urihttp://creativecommons.org/licenses/by/3.0/us/*
dc.sourcecrossref
dc.subject.enthermal resistance estimation IR thermography
dc.subject.eninverse processing
dc.title.enEstimation of Thermal Resistance Field in Layered Materials by Analytical Asymptotic Method
dc.typeArticle de revueen_US
dc.identifier.doi10.3390/app10072351en_US
dc.subject.halSciences de l'ingénieur [physics]/Mécanique [physics.med-ph]en_US
bordeaux.journalApplied Sciencesen_US
bordeaux.page2351en_US
bordeaux.volume10en_US
bordeaux.hal.laboratoriesInstitut de Mécanique et d’Ingénierie de Bordeaux (I2M) - UMR 5295en_US
bordeaux.issue7en_US
bordeaux.institutionUniversité de Bordeauxen_US
bordeaux.institutionBordeaux INPen_US
bordeaux.institutionCNRSen_US
bordeaux.institutionINRAEen_US
bordeaux.institutionArts et Métiersen_US
bordeaux.peerReviewedouien_US
bordeaux.inpressnonen_US
bordeaux.import.sourcedissemin
hal.identifierhal-02998127
hal.exportfalse
workflow.import.sourcedissemin
dc.rights.ccCC BYen_US
bordeaux.COinSctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Applied%20Sciences&rft.date=2020-03-30&rft.volume=10&rft.issue=7&rft.spage=2351&rft.epage=2351&rft.eissn=2076-3417&rft.issn=2076-3417&rft.au=GROZ,%20Marie-Marthe&BENSALEM,%20Mohamed&SOMMIER,%20Alain&ABISSET-CHAVANNE,%20Emmanuelle&CHEVALIER,%20St%C3%A9phane&rft.genre=article


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