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Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope
(Microelectronics Journal. vol. 35, n° 10, pp. 797-803, 2004-10)Article de revue -
Joule Expansion Imaging Techniques on Microlectronic Devices
Communication dans un congrès -
Determination of Thermophysical Properties of Si/SiGe Superlattices with a Pump-Probe Technique
Communication dans un congrès -
Thermal diffusivity measurements on a single fiber with microscale diameter at very high temperature
(International Journal of Thermal Sciences. vol. 45, n° 5, pp. 443-451, 2006-05)Article de revue -
Estimation of the transverse coefficient of thermal expansion on carbon fibers at very high temperature
(Inverse Problems in Science and Engineering. vol. 15, n° 1, pp. 77-89, 2007-01)Article de revue -
Specific-heat measurement of single metallic, carbon, and ceramic fibers at very high temperature
(Review of Scientific Instruments. vol. 76, n° 6, pp. 064901, 2005-06)Article de revue -
Qualitative Temperature Variation Imaging by Thermoreflectance and SThM Techniques
Communication dans un congrès -
Quantitative thermoreflectance imaging : calibration method and validation on a dedicated integrated circuit
Communication dans un congrès -
Dynamical behavior of the scanning thermal microscope (SThM) thermal resistive probe studied using Si/SiGe microcoolers
(Superlattices and Microstructures. vol. 38, n° 1, pp. 69-75, 2005-07-06)Article de revue